Nikon séries BW-S500 / BW-D500
Nikon's proprietary scanning-type optical interference measurement technology achievees 1pm* height resolution.
Quickly and accurately measures surface profile from sub-nano to millimeter height ranges, using a single measurement mode. Fully supports high-precision processing technology and advanced material development of the Materials Science field.
* Height resolution specified by algorithm
The BW-S500/BW-D500 series is calibrated by an 8 nm or 8 μm VLSI Step Height Standards sample, certified by the NIST. Achieves extremely high accuracy and repeatability as a height measurement system.
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LED Lichtquelle und Lampenhäuser zu Biologie Mikroskope / Materialmikroskope
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Starlight replacement LED light lamp housing for biological and material microscopes
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SERVICE & REPAIR
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Ryf dust covers
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