Jeol-Nikon JCM-7000 Benchtop (obsolete)

Jeol-Nikon JCM-7000 Benchtop Scanning Electron Microscope:

The JCM-7000 Benchtop Scanning Electron Microscope is designed based on a key concept of "Easy-to-use SEM with seamless navigation and live analysis". The JCM-7000 incorporates three innovative functions; "Zeromag" for smooth transition from optical to SEM imaging, "Live Analysis" for finding constituent elements for an image observation area, and "Live 3D" for displaying a reconstructed live 3D image during SEM observation. When you place the JCM-7000 next to an optical microscope, further-faster and more-detailed foreign material analysis and quality control can be made.

The JCM-7000 Benchtop Scanning Electron Microscope is designed based on a key concept of "Easy-to-use SEM with seamless navigation and live analysis". When you place the JCM-7000 next to an optical microscope, further-faster and more-detailed foreign material analysis and quality control can be made.

Main Features:With our "Zeromag" function, sample navigation is even easier than ever before. "Zeromag" which links the CCD image with color information with the SEM image on surface details, enables you to quickly locate areas for imaging and analysis.With the aid of a 2-axis (X, Y) motorized stage, work efficiency is enhanced and montage images can easily be collected for a large specimen area.With our Analytical series ("Live Analysis" function), the embedded EDS system shows a real time EDS spectrum during image observation for quick and efficient elemental analysis.A new "Live 3D" function enables simultaneous observation of a live SEM image and a reconstructed live 3D surface image, together with acquisition of topographic and depth information.