Nikon metrology MCT225 HA

MCT225 HA: The future of Metrology

This new ‘absolute-accuracy’ Metrology-CT (MCT) system guarantees that all internal and external geometry is measured efficiently with the highest accuracy. A proprietary liquid cooled microfocus transmission source, a finite element optimized support frame for maximum stiffness, and air-cooled cabinet provide long-term stability. These enable the MCT225 HA to achieve an impressive MPEl accuracy specification of 3.8 + L/50μm. MCT225 HA offers superior measuring accuracy and small feature detection to inspect precision plastic parts, small castings and complex parts and assemblies.

Key benefits

• A blend of more than
  • 95 years’ Nikon experience in Optical Metrology
  • 50 years’ LK experience in Coordinate Measuring Machine (CMM)
  • 25 years’ X-Tek experience in X-ray Computed Tomography (CT)
• Absolute accuracy MPEl 3.8 + L/50 μm in accordance with the VDI/VDE 2630
• Proprietary microfocus source developed for metrology CT purposes
• High-precision mechatronics increase sample manipulation accuracy
• Powerful visualization and analysis provide detailed insight
• Suitable for a wide range of sample sizes and material densities