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NEXIV Confocal Series VMZ-K3040 and VMZ-K6555 3D

NEXIV Confocal Series VMZ-K3040  and  VMZ-K6555 3D: FOV Mesurements Generated with confocal images:

A ground-breaking multifunctional video measuring system developed on the strength of Nikon’s leading optomechatronics technology.

Incorporates confocal technology, brightfield with a 15X zoom, and Laser AF. No matter what geometrical measurements are needed, two-dimensional or three-dimensional, inspection and evaluation is exceptionally fast and accurate.

The Confocal NEXIV can be optimally used for measurements of a variety of bump heights on advanced IC packages, such as wafer-level CSP, as well as for the inspection of highly complicated structures of MEMS and probe card.

Features

  • Simultaneous wide-area height measurements with Nikon proprietary confocal optics
  • 2D measurement with 15x brightfield zoom optics
  • Fully compatible with 300 mm wafer measurement at semiconductor fabs

Applications

  • IC Packages

o    Flip Chip/COF(Bump)/COG

o    CSP (FBGA)/SIP (Bump, Wire)

o    Interposer (Pad height)

  • MEMS
  • Probe Card (Silicon Probe, Au Probe)
  • Precise Glass Components (Micro Lens, Contact Lens)
  • Photo Spacer Width/Height for Color Filter for FPD Panel

VMZ-K6055:

Objective lens

Magnification

3x

7.5x

15x

30x

Working Distace

24 mm

5 mm

20 mm

5 mm

Confocal optics (area height measure)

Field of view

4 x 3 mm

1.6 x 1.2 mm

0.8 x 0.6 mm

0.4 x 0.3 mm

Height measurement repeatability (2σ)

0.35 μm

0.25 μm

0.25 μm

0.20 μm

Height measurement resolution

0.01 μm

Brightfield optics (2D measurement)

Zooming method

Motorized 5-step zoom

Field of view

4 x 3mm to 0.27 x 0.2 mm

1.6 x 1.2mm to 0.11 x 0.08 mm

1.26 x 0.95mm to 0.1 x 0.074 mm

0.63 x 0.47mm to 0.05 x 0.04 mm

Illumination

White LED

Autofocus

Vision AF, Laser AF

Main body

Stroke (X, Y, Z)

300 x 400 x 150 mm

Accuracy guaranteed loading capacity

30 kg

Maximum permissible error

EUX,MPE EUY,MPE

1.5 + 4L/1000μm

EUXY,MPE

2.5 + 4L/1000μm

EUZ,MPE

1 + L/1000μm

Main unit weight

830kg

Power source/power consumption

AC 100 to 240 V ± 10% 50/60 Hz / 13A to 6.5A

Operating condition

Temperature: 20°C ± 0.5K, Humidity: 70% or less

Acquired standard

CE marking (low voltage/EMC/laser)

Footprint

2500 x 190 0mm

VMZ-K3040:

Objective lens

Magnification

3x

7.5x

15x

30x

Working Distance

24 mm

5 mm

20 mm

5 mm

Confocal optics (area height measure)

Field of view

4 x 3 mm

1.6 x 1.2 mm

0.8 x 0.6 mm

0.4 x 0.3 mm

Height measurement repeatability (2σ)

0.35 μm

0.25 μm

0.25 μm

0.20 μm

Height measurement resolution

0.01 μm

Brightfield optics (2D measurement)

Zooming method

Motorized 5-step zoom

Field of view

4 x 3mm to 0.27 x 0.2 mm

1.6 x 1.2mm to 0.11 x 0.08 mm

1.26 x 0.95mm to 0.1 x 0.074 mm

0.63 x 0.47mm to 0.05 x 0.04 mm

Illumination

White LED

Autofocus

Vision AF, Laser AF

Main body

Stroke (X, Y, Z)

300 x 400 x 150 mm

Accuracty guaranteed loading capacity

20 kg

Maximum permissible error

EUX,MPE EUY,MPE

1.5 + 4L/1000 μm

EUXY,MPE

2.5 + 4L/1000 μm

EUZ,MPE

1 + L/1000 μm

Main unit weight

850 kg

Power source/power consumption

AC 100 to 240 V ± 10% 50/60 Hz / 13A to 6.5A

Operating condition

Temperature: 20°C ± 0.5K, Humidity: 70% or less

Acquired standard

CE marking (low voltage/EMC/laser)

Footprint

2500 x 1600 mm

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